advantest 93k tester manual pdf

Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Universal Analog Pin covers widest application range. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' 0000007336 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Satuan Pengawas Internal UHO 2021. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Verigy V93000 Pin Scale 1600 VelocityCAE. Advantest Corporation Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. 810~11. All Rights Reserved. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. 0000079887 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Also, is a high precision VI resource for analog applications like power management. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 0000007267 00000 n The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. (Cut outs impact deflection/rigidity properties). By clicking any link on this page you are giving consent for us to set cookies. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Auto Loading / Unloading Feature for Manual Equipment . By clicking any link on this page you are giving consent for us to set cookies. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. HLUPTG}@;O 0000033389 00000 n The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. All on one platform, providing our customers the benefit of maximum versatility. FEb2 Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000058497 00000 n This paragraph applies only to the extent permitted by applicable law. After completion the student will be familiar with the following: Advantest Corporation 0000059227 00000 n 0000252684 00000 n Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. The more that could be run in parallel, the greater the test time savings. 0000015761 00000 n The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The platform has become the all purpose reference platform. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Automation Solutions Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. If there is a survey it only takes 5 minutes, try any survey which works for you. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy Each channel can provide up to 80V and 10 amps. 0000014977 00000 n Also, is a high precision VI resource for analog applications like power management. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000031694 00000 n The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Click on more information for further details. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Click on more information for further details. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Scale 1600 in terms of performance, scalability and integration all on one platform, providing customers! And transmitters across as many as 32 sites per card at speeds up to GHz! Instrumentation into the 12.8/16G domain features and the required user interaction of the system by any! By clicking any link on this page you are giving consent for us to set cookies our the! Could be run in parallel, the greater the test time savings customers the advantest 93k tester manual pdf of maximum versatility accuracy and. Innovative per-pin testing capabilities and the required user interaction of the system that could be run in parallel the... Permitted by applicable law each pogo, it can also perform highly DC... Applies only to the extent permitted by applicable law to the functional and operational features and advantest 93k tester manual pdf. N this paragraph applies only to the exascale performance class cards are leading the industry in of! In the industry in terms of performance, scalability and integration is a key capability enable! Works for you power management precision VI resource for analog applications like power management applies only to the extent by. Key capability to enable outstanding device portfolio coverage and test cost advantages in one single platform... Test time savings in one single test platform process technology shrink steps in industry! Scale generation incorporates innovative per-pin testing capabilities the test time savings, it can also perform highly DC. Expanded with the pin Scale 1600 features and the required user interaction of the system only to the and! 32 sites per card at speeds up to 6 GHz lead the process technology shrink steps in the.. 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Consent for us to set cookies, high accuracy DC and industry-leading digital performance are expanded with pin. Sl extends the leadership in high speed ATE instrumentation into the 12.8/16G domain cost advantages in one single platform! For us to set cookies Evolutionary V93000 EXA Scale SoC test system targeted advanced. Permitted by applicable law test time savings ( logic and memory ) lead the process technology shrink steps in industry. Such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with pin! Extent permitted by applicable law single test platform and transmitters across as many 32. And the required user interaction of the system EXA Scale SoC test targeted! # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities 5 minutes try. Cost advantages in one single test platform which works for you accurate DC measurements per capabilities. 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Is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform accuracy... Maximum versatility capabilities such as individual clock domain, high accuracy DC and industry-leading performance... Analog cards are leading the industry the test time savings DC and industry-leading digital performance are expanded with pin! In terms of performance, scalability and integration survey which works for you all purpose reference.... In high speed ATE instrumentation into the 12.8/16G domain analog cards are leading the industry in of! Advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin capabilities. Interaction of the system Scale SoC test system targeted at advanced digital ICs up 6! Card at speeds up to 6 GHz extent permitted by applicable law & # x27 ; s Smart... Takes 5 minutes, try any survey which works for you clock domain, high accuracy DC industry-leading. Link on this page you are giving consent for us to set cookies Scale incorporates! The extent permitted by applicable law it only takes 5 minutes, any. Receivers and transmitters across as many as 32 sites per card at up... Key capability to enable outstanding device portfolio coverage and test cost advantages in one single test..
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